Ultrascan: using time-division demultiplexing/multiplexing (TDDM/TDM) with virtualscan for test cost reduction
Laung‐Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang · 2006
This paper describes time-division demultiplexing and multiplexing of high-data-rate scan patterns applied on I/O's into low-data-rate scan patterns applied on VirtualScan compression circuitry to further reduce test application time and test pin-count without coverage loss