Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
H. Konuk, F. Joel Ferguson · 2002
Shorts and opens are the most common types of defects in today's CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare the factors affecting the probabilities for an interconnect open and a feedback bridging fault to oscillate or display sequential behavior.