Scan diagnostic strategy for the series 10000 PRISM workstation
Mike Ricchetti, J. Hoglund · 2003
The Series 10000 PRISM workstation has been designed to be testable using scan path techniques. An overview of the scan architecture at the chip and system levels shows the basis on which a diagnostic strategy was developed. These strategies were used to achieve diagnostics goals of high fault coverage and component-level fault isolation. A unique fault-isolation method is described which is based on scan path features of the Series 10000 and a logic partitioning method. The software tool set used in scan test development on the Series 10000 is also introduced.>