A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior
Rao Desineni, Osei Poku, Ronald DeShawn Blanton · Proceedings/Proceedings - International Test Conference · 2006
DIAGNOSIX is a comprehensive fault diagnosis methodology for characterizing failures in digital ICs. Using limited layout information, DIAGNOSIX automatically extracts a fault model for a failing IC by analyzing the behavior of the physical neighborhood surrounding suspect lines. Results from several simulated and over 800 failing ICs reveal a significant improvement in localization. More importantly, the output of DIAGNOSIX is an accurate model of the logic-level defect behavior that provides useful insight into the actual defect mechanism. Experiment results for the failing chips with successful physical failure analysis reveal that the extracted faults accurately describe the actual defects