On the testability of one-dimensional ILAs for multiple sequential faults
Anastasios Vergis · IEEE Transactions on Computers · 1992
It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m/sup 2/n/sup 2/+mn/sup 3/)*K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K>