Forward-Looking Reverse Order Fault Simulation for $n$ -Detection Test Sets
Irith Pomeranz, Sudhakar M. Reddy · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009
We extend the concept of forward-looking reverse order fault simulation ton-detection test sets. Forward-looking reverse order fault simulation is an efficient static test compaction process similar to reverse order fault simulation, but with the advantage that it results in test sets that do not contain any unnecessary tests. The application of test compaction procedures ton-detection test sets is important since the test sets are larger than conventional test sets. We demonstrate that forward-looking reverse order fault simulation produces smaller test sets than reverse order fault simulation and measure the quality of the resulting test sets by their bridging fault coverage.