Bridges in sequential CMOS circuits: current-voltage signature
Rosa Rodriguez-Montanes, Joan Figueras · 2002
The I/sub DDQ/-V/sub DD/ signature for sequential CMOS circuits with bridging defects is characterized. In combinational circuits with a bridging defect, an increase in V/sub DD/ results in a higher I/sub DDQ/ value flowing through the defect, however, the total current may decrease as it will be shown. In sequential circuits with bridging defects connecting control loop nodes, the V/sub DD/-I/sub DDQ/ signature may present intervals of constant non defective I/sub DDQ/ value. The signature may be used to diagnose certain types of bridging defects in sequential CMOS circuits.