An Algorithm for the Generation of Test Sets for Combinational Logic Networks
D.T. Wang · IEEE Transactions on Computers · 1975
An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.