A simulation-based JTAG ATPG optimized for MCMS
Andrew Flint · 2002
Boundary scan test generation tools generate tests based on the netlist of the design. Netlist-based tools are very efficient in designs with a high percentage of boundary scan devices, but can be inefficient in designs containing a significant percentage of non-compatible ICs. An alternative method, in which the user defines the nets to test, is explored.