Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach
SUNIL RANJAN DAS, Jila Zakizadeh, Satyendra N. Biswas, Mansour H. Assaf, Amiya R. Nayak, Emil M. Petriu, Wen-Ben Jone, Mehmet Şahinoglu · IEEE Transactions on Instrumentation and Measurement · 2007
This paper aims to develop an approach to test analog and mixed-signal embedded-core-based system-on-chips (SOCs) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this paper. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers, which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness, and relevance of the proposed implementations