Fault coverage of DC parametric tests for embedded analog amplifiers
Mani Soma · 2002
The test quality of DC parametric manufacturing test sets is evaluated versus the open fault model for analog amplifiers. Using two case studies in CMOS and bipolar technologies, the fault coverage of the test set is shown to be rather low (less than 80%). Several open faults in the signal path remain undetected. When the amplifiers are embedded in a larger circuit, the functional test set is usually unable to detect these faults as well. Detection is strongly correlated to circuit topology in two signal processing circuits used as examples. Test selection guidelines are presented