On the use of procedural models for generation of test programs
Robert Tien-Wen Chien, R. Fletcher, Wei-Der Ho, L. Peterson · IEEE Transactions on Circuits and Systems · 1979
An approach based on artificial intelligence concepts is developed for automatic generation of test programs for analog circuits. The programs will, with the help of automatic test equipment (ATE), make appropriate measurements and deduce the location of potential faults in analog circuit boards.