Application of Multiple Observation Time Strategy in Test Generation of digital sequential circuits Yu.A.Skobtsov, V.Yu.Skobtsov, S.N.Hindi
Yuri Skobtsov · 2009
The test generation method is designed for digital circuits with memory on the basis of distinguishing state pairs of good and fault devices. The multiple observation time test strategy, 16-valued alphabet and genetic algorithms are used . The proposed method permits to cover the faults that are not detected with