Test Data Compression Based on Clustered Random Access Scan
Yu Hen Hu, Cheng Li, Jia Li, Yinhe Han, Xiaowei Li, Wei Wang, Huawei Li, Laung‐Terng Wang, Xiaoqing Wen · Asian Test Symposium · 2006
We proposed a Clustered Random Access Scan (CRAS) architecture to reduce test data volume. CRAS makes use of the compatibility of the test stimuli to cluster the scan cells, and assigns every cluster a unique address. The compression ratio upper bound of CRAS is analyzed based on the random graph theory. Experimental results on ISCAS?89 benchmarks and two industry designs show that the proposed CRAS architecture can yield on average 67.3% reduction in test data volume, with reasonable area and routing overhead than scan design.