Diagnosis of Scan Clock Failures
King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2008
In this paper we present a fault diagnosis procedure for defects in the scan clock tree. We first identify the candidate clock tree buffers common to failing chains by backtracing. We then evaluate and rank these candidates by forward tracing and simulation. Experimental results show that the proposed procedure provides accurate diagnosis of scan clock failures.