Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults
Jae‐Hoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park · IEEE Transactions on Circuits & Systems II Express Briefs · 2009
The effect of crosstalk-induced errors becomes more significant in high-performance circuits and systems. In this paper, compact crosstalk test patterns are introduced for a system-on-a-chip and board level interconnects considering physically effective aggressors. By being able to target multiple victim lines, 6n, wherenis the number of nets patterns are drastically reduced to a constant number 6D, whereDindicates the effective distance among interconnect nets. The test quality for static and crosstalk faults are completely preserved with 6Dpatterns.