Multi-vector tests
Shideh Shahidi, Sandeep K. Gupta · 2008
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the value at a circuit's output deviates from the corresponding error-free value, has been identified as a key metric for severity. In error-rate testing every chip that has an error rate greater than or equal to a threshold specified by the application is unacceptable for the application and discarded; all other chips are acceptable. The objective of error-rate testing is to reject every unacceptable chip while accepting all (or a maximum number) of the acceptable chips.