An analytical model for the aliasing probability in signature analysis testing
M. Damiani, Piero Olivo, Michele Favalli, B. Riccò · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989
The Markov chain model of linear feedback shift-registers (LFSRs) for signature analysis testing is analytically solved to obtain the exact expression of the aliasing error probability as a function of test length, error probability, and the structure of the feedback network. The dependence on feedback configuration is explored in depth, and it is proven that maximum-length LFSRs have the best performances with respect to aliasing, regardless of the particular structure of their feedback network. Simplified expressions of aliasing probability are also derived for use as practical tools to design LFSRs for IC signature analysis testing, and a heuristic criterion is given for the identification of peaks in aliasing probability.>