Microsystems Testing: an Approach and Open Problems
Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois · 1998
In this work a Computer-Aided Testing (CAT) tool is proposed that brings a systematic way of dealing with testing problems in emerging microsystems. Experiments with case-studies illustrate the techniques and tools embedded in the CAT environment. Some of the open problems that shall be addressed in the near future as an extension to this work are also discussed.