Online self-repair of FIR filters
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, P. Prinetto · IEEE Design & Test of Computers · 2003
Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs.