Processor-based built-in self-test for embedded DRAM
J. Dreibelbis, John Barth, H.L. Kalter, Rex Kho · IEEE Journal of Solid-State Circuits · 1998
A built-in self-test engine and test methodology have been developed for testing a family of high-bandwidth, high-density DRAM macros. The DRAM macros range in size from 256/spl times/16/spl times/128 to 2 K/spl times/16/spl times/256 (Word/spl times/Bit/spl times/Data) and are targeted for embedded applications in application-specific integrated circuit designs. The processor-based test engine, with two separate instruction storage memories, combines with flexible address, data, and clock generators to provide DRAM high-performance ac testing using a minimum of dedicated test pins. Test results are compressed through on-macro, two-dimensional, redundancy allocation logic to provide direct programming information for the fuser via a serial scan port. The design is intended for reuse on future DRAM-generation subarrays and can be adapted to any number of address or data-pin configurations.