Test Data Volume Comparison: Monolithic vs. Modular SoC Testing
Ozgur Sinanoglu, Erik Jan Marinissen, Anuja Sehgal, Jeff Fitzgerald, Jeff Rearick · IEEE Design & Test of Computers · 2009
Containing production cost is a major concern for today's complex SoCs. One of the key contributors to production cost is test time and test data volume, for which numerous compression techniques were proposed. This article introduces a different approach to test data volume reduction, namely the use of modular test based on IEEE Std 1500 architecture, and it provides modeling, analysis, and quantification to support the proposed approach.