Achieving Board-Level BIST Using the Boundary-Scan Master
Najmi Jarwala, Chi W. Yau · 2005
A board-level test strategy based on ANSIhEEE Std 1149.1-1990 is presented. A essential component of tlhis strategy is an intelligent parallel-serial protocol conviersion dievice-the Boundary-Scan Master (BSM). With the BSM, we can rapidly realize generic board level Built., In Self-Test (BIST) with a minimal amount of effort.