Use of DFT techniques in speed grading a 1 GHz+ microprocessor
D. Belete, A. Razdan, Willi G. Schwarz, Rajesh Raina, Charles F. Hawkins, J.C. Morehead · 2003
This paper presents a practical case-study of using DFT techniques for speed-grading the Motorola MPC7455, a 1 GHz+ microprocessor. The effectiveness of transition fault detection, path-delay AC-scan patterns and array BIST is compared with that of functional patterns for speed-grading the parts. We discuss the capabilities and challenges of using the DFT methods based on production data.