Dynamic fault dictionaries and two-stage fault isolation
P.G. Ryan, W.K. Fuchs · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1998
This paper presents dynamic two stage fault isolation for sequential random logic VLSI circuits, and introduces limited and dynamic fault dictionaries. In the first stage of the dynamic process, a limited fault dictionary identifies candidate faults, which are further distinguished in the second stage by a dictionary generated dynamically for the candidate faults and a subset of the test vectors. This provides high resolution but avoids the costs of full static dictionaries. Two-stage fault isolation is evaluated for benchmark circuits and on defects in industrial circuits.