Design of stuck-open fault testable CMOS complexgates
Yiorgos E. Tsiatouhas, Th. Haniotakis, Constantin Halatsis, A. Arapoyanni · Electronics Letters · 1996
Tests that detect transistor stuck-open (TSOP) faults independent of timing skews in input changes may not exist for all TSOP faults in CMOS complex gates. A new design method is presented which does not require any extra hardware or test inputs to improve the testability of a CMOS complex gate.