Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparison
Taku Ninomiya, K. Yoshimura, M. Nomoto, Y. Nakagawa · 2003
Describes a new automatic pattern inspection method which can reliably detect fatal circuit defects without giving false alarms due to circuit patterns with slightly jagged edges. Also described is a high-speed automatic inspection system for screen-printed circuit patterns of an unbaked ceramic layer, known as a green sheet. For fatal defect detection, the connectivity comparison method was adopted. In order to speed up this method and to further improve it, connectivity preserving image size reduction, a new concept, was developed.>