I/sub DDQ/ current dependency on test vectors and bridging resistance
Arabi Keshk, Yoshio Miura, K. Kinoshita · 2003
In this paper, we focus on how the I/sub DDQ/ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large I/sub DDQ/ is easier than a small I/sub DDQ/ because the value of I/sub DDQ/ is normally of the order of microamperes. If suitable logic values are assigned to the faulty nodes, a small channel resistance will be obtained and then a large I/sub DDQ/ will flow. We have performed the simulation to show that the value of I/sub DDQ/ depends on the test vectors that applied to the faulty nodes for external and internal bridging nodes. As a result, I/sub DDQ/ at the low resistance-bridging fault increased bp 26%-36% for external bridging faults between different gates. For the internal bridging fault between any gates, the increased I/sub DDQ/ is 27%-159% for all resistive bridging faults.