Defect Tracing System Based on Orthogonal Defect Classification
Pan Tiejun, Zheng Leina, Fang Chengbin · 2008
With the increase of the software complexity, the defect measurement becomes a task of high priority. We give a new software defect analytical methodology based on orthogonal classification. This method has two folds. Then a set of orthogonal defect classification (ODC) reference model is given which includes activity, trigger, severity, origin, content and type of defect. In the end, it gives a support tool and concrete workflow of defect tracing. In contrast with the traditional method, this method not only has the advantages of popularity, haleness and low cost, but also improves the accuracy of identifying defects notably. Thus it offers a strong support for the prevention of defects in software products.