Expediting ramp-to-volume production
H. Balachandran, James R. Parker, Gordon Gammie, J. Olson, Craig Force, Kenneth M. Butler, S. Jandhyala · 2003
High levels of integration have complicated the entire IC manufacturing process. Crucial steps such as ramp to volume production and yield improvement techniques are being challenged. In this paper, a diagnostic system that has been developed and deployed into a production environment is presented. Experiments conducted demonstrating the value of the diagnostic tool and its limitations are presented.