Classifying Bad Chips and Ordering Test Sets
Francois-fabien Ferhani, Edward R. McCluskey · Proceedings/Proceedings - International Test Conference · 2006
This paper shows data related to choosing a pair of test sets for digital IC production test. This data demonstrates that the choice of the second set of the pair should take into account the test metric used for the first test set. An approach for making this choice by taking defect coverage and total test length into account is presented