Design of phase shifters for BIST applications
Janusz Rajski, Jerzy Tyszer · 2002
The paper presents novel systematic design techniques for the automated synthesis of phase shifter circuits used to remove effects of structural dependencies featured by test generators driving parallel scan chains. As shown in the paper, it is possible to synthesize very large and fast phase shifters for BIST applications with guaranteed phaseshifts between scan chains and very small number of gates per channel.