Thickness precision measurement method of sheath and insulation materials based on image processing
Xia Shu-lan, Jilin Wang · 2011
Subpixel is a key technology of image processing technology. It can achieve positioning better than entire pixel precision to the target. Against the shortcoming of slow speed of general Zernike moment subpixel location method, proposed an improved Sobel-Zernike moment positioning method in the software algorithms of sheath and insulation materials thickness image measurement system, improved the edge point criterion and the edge subpixel coordinates formula, optimized the edge of a single pixel contour, achieved precise and rapid measurements, and the experiment display is faster than 80%.