REGGEN-Test pattern generation on register transfer level
A. Magdolen, J. Bezakova, Elena Gramatová, M. Fischerova · 2002
The authors describe the functional test generator REGGEN on a register transfer level. The technique of the symbolic simulation was modified by new rules to simplify symbolic expressions. In the REGGEN system a fault simulator at the RT level is also implemented. The efficiency of the REGGEN system has been proved on several gate arrays.>