Pascant: a partial scan and test generation system
Sudipta Bhawmik, C.J. Lin, Kwang-Ting Tim Cheng, Vishwani D. Agrawal · 2002
The authors present Pascant, a system that consists of an intelligent partial-scan flip-flop-selection algorithm and a sequential circuit test generator. The algorithm for selection of flip-flop is based on the identification and elimination of strongly connected components in a circuit graph and is shown to be more efficient than previously reported methods. An additional testability criterion based on consecutive self-loops is also presented. An overview of the Pascant system is presented with emphasis on its scan flip-flop-selection method. Test generation results for 29 of the 31 ISCAS'89 sequential benchmark circuits are given.>