Built-in test compiler in an ASIC environment
E. Archambeau, K. Van Egmond · 2003
A built-in test (BIT) block compiler integrated into a set of design tools is described. One module of the BIT compiler generates both a structural description and a behavioral simulation model for pseudorandom pattern generators and signature analyzers, based on a linear feedback shift register technique. The details of this module and a technique for merging the built-in test into a complete ASIC test program are shown.>