Compact structural test generation for analog macros
V. Kaal, Hans G. Kerkhoff · 1997
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-ares of the test configurations is investigated to identi3 a collapsed high-quality test set. 1