A scalable autotest platform for embedded system
Di Liu, Qiao Su, Yan Xie · 2010
The complex and diversity of embedded system make the developing and testing embedded system a hard work. Providing a high-availability high-scale universal testing platform can improve the development of embedded software. The autotest platform focuses on layered scalability and continuous integration. Loose coupling between the layers makes the system easy to extend at the local layer. Continuous improvements reduce the initial investment, optimize the platform implementation, and expand capacity and capabilities according to requirements. Users commit test requests front-end, and background centralized testing cluster executes this task and returns results to users.