Analysis of Resistive Open Defects in a Synchronizer
Hyoung-Kook Kim, Wen-Ben Jone, Laung‐Terng Wang · 2009
This paper presents fault modeling and analysis for open defects in a synchronizer that is implemented by two D flip-flops. Open defects are injected into any node of the synchronizer, and HSPICE is used to perform circuit analysis. The major purpose of this analysis is to find all possible faults that might occur in the synchronizer by open defects. The results obtained can be used to develop methods for testing the interfacing circuits between different clock domains which are implemented with the synchronizer.