Trends in testing integrated circuits
Bart Vermeulen, Charanpreet Singh Hora, Bram Kruseman, Erik Jan Marinissen, Robert van Rijsinge · 2005
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.