Testability features of the AMD-K6 microprocessor
R.S. Fetherson, I.P. Shak, S.C. Ma · IEEE Design & Test of Computers · 1998
The AMD-K6's embedded design-for-testability structures and test pattern development methodologies provide high-quality manufacturing tests. The DFT features support static voltage-level testing for wafer-sort and debug testing, application of two pattern sequences for detection of timing-related failures, scan-based BIST, and 1149.1 boundary scan.