Two-test two-function technique for fault detection in digital combinational circuits
P. V. DEO · International Journal of Electronics · 1986
A test method is proposed for detecting single and multiple faults in digital combinational circuits. The method requires only two test input combinations. An additional output is generated such that this output is equal to the original output for all the input combinations except the two test inputs. Such an output can be easily implemented. The same two test inputs are also capable of detecting faults in this additional circuitry. The proposed method is unique since only two tests are sufficient to detect single and multiple faults, irrespective of the circuit structure and the number of inputs.