An embedded march algorithm test pattern generator for memory testing
Weilun Wang, Kuen-Jong Lee, Jhing-Fa Wang · 2003
The memory cores are essential for a system-on-a-chip (SOC). To test the memory cores, in this paper we propose a generalized embedded test pattern generator for any march algorithm. Without loss of functionality of the march algorithm, we also present a systematic procedure with a short time complexity to reduce the hardware cost of the test pattern generator.