On image analysis by the methods of moments
C.-H. Teh, R.T. Chin · IEEE Transactions on Pattern Analysis and Machine Intelligence · 1988
Various types of moments have been used to recognize image patterns in a number of applications. A number of moments are evaluated and some fundamental questions are addressed, such as image-representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments, and complex moments. Properties of these moments are examined in detail and the interrelationships among them are discussed. Both theoretical and experimental results are presented.>