Test set compaction algorithms for combinational circuits
İlker Hamzaoğlu, Janak H. Patel · 1998
Thispaperpresents two new algorithms, Redundant Vec-torElimination (RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under the single stuck at fault model, and a new heuristic for estimating ihe minimum single stuck at fault test set size.7hese algon.thmstogether with the dynamic compaction algorithm are incorporated into an advancedATPG systemfor combinational circuits, called MinTest.MinTestfound better lower bounds and generated smaller test sets than the previ-OUSIJY published resultsfor the ISCAS85 andfill scan version of the ISCAS89 benchmark circuits.I