Surface Integration: Two Statistical Approaches
William A. P. Smith, Edwin R. Hancock · International Conference on Image Analysis and Processing · 2007
In this paper we show how statistical constraints can be incorporated into the surface integration process. This problem aims to reconstruct the surface height function from a noisy field of surface normals. We propose two methods that employ a statistical model that captures variations in surface height. The first uses a coupled model that captures the variation in a training set efface surfaces in both the surface normal and surface height domain. The second is based on finding the parameters of a surface height model directly from afield of surface normals. We present experiments on ground truth face data and compare the results of the two methods with an existing surface integration technique.