Real-time feature tracking and outlier rejection with changes in illumination
Hailin Jin, Paolo Favaro, Stefano Soatto · 2002
We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combined model of geometry and photometry, that is used to track features as well as to detect outliers in a hypothesis testing framework. The algorithm runs in real time on a personal computer; and is available to the public.