Faster processing for microprocessor functional ATPG
J. Hirase, S. Yoshimura · 2002
In order to improve the quality of microprocessor tests, the use of instruction sets for testing is indispensable. This paper discusses how fault coverage can be improved with a short test pattern that repeatedly samples an R number of instructions as L sets from an S number of instructions and selects from amongst these L sets those for which the fault coverage can be improved. Continuing, it argues that the processing speed can be increased by selecting a certain number of sets containing an R number of instructions from an S number of instructions. This approach proved effective in tests using software created on these principles.