FANHAT: fanout oriented hierarchical automatic test generation system
H.B. Min, William A. Rogers, H.-t.A. Luh · 2003
FANHAT, has been designed and implemented to accelerate test generation for digital circuits. FANHAT uses a minimal hierarchical representation of the circuit and functional level heuristics to perform implication, propagation, and backtracking with high-level functional model. Experiments with three circuits show hierarchical test generation using FANHAT is 1.5 to 8.9 times faster than flat gate-level test generation.>