Design based analog testing by Characteristic Observation Inference
W.M. Lindermeir, Helmut Graeb, Kurt J. Antreich · 1995
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Obser-vation Inference (COI), is presented. In many situations, it is prohibitive to directly verify the circuit specifications due to the test equipment costs. Our approach consid-ers a given universal set of reasonable input stimuli and measurements that can be performed with the given test equipment. From this universal set, a minimal number of measurements is automatically selected that represent a set of observations characterizing the state of the circuit under test with respect to parametric faults. A parametric fault model is introduced which is related to the individualcircuit specifications. For each given circuit specification, a cor-responding test inference criterion is computed, based on logisticdiscriminationanalysis. By applying these criteria, the satisfaction or violation of the given circuit specifica-tions can be inferred from the observations of the circuit under test. The COI method applied to a complex operational amplifier yields very encouraging simulated results with respect to parametric faults as well as to catastrophic faults. 1